Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations

Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations

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All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures.Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations,Volume III examines representation as expressed in axiomatization and invariance.Reprint of the Academic Press, New York and London, 1989 edition.
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Data sheet

Name of the Author
Amos Tversky
David H. Krantz
Patrick Suppes
R. Duncan Luce
Language
English
Series
Foundations of Measurement, Vol. II
ISBN
9780124254022
Release date
1989

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Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations

All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, establish...

Write your review

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