Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations
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All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, established the formal foundations for measurement, justifying the assignment of numbers to objects in terms of their structural correspondence.Volume I introduces the distinct mathematical results that serve to formulate numerical representations of qualitative structures.Volume II extends the subject in the direction of geometrical, threshold, and probabilistic representations,Volume III examines representation as expressed in axiomatization and invariance.Reprint of the Academic Press, New York and London, 1989 edition.
LF/180723/R
Характеристики
- ФИО Автора
- Amos Tversky
David H. Krantz
Patrick Suppes
R. Duncan Luce - Язык
- Английский
- Серия
- Foundations of Measurement, Vol. II
- ISBN
- 9780124254022
- Дата выхода
- 1989
6 книг этого же автора
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All of the sciences―physical, biological, and social―have a need for quantitative measurement. This influential series, Foundations of Measurement, establish...