Book 328 Methods for measuring the parameters of semiconductors and dielectrics . Razd. Electrophysical and Photovoltaic Methods of Measurement by Zhuravleva V. B. , Ladygina E. A. , Martynova V. N. and L. Spitsina G. It is a valuable work that immerses the reader in the world of modern technologies and methods used for the analysis of semiconductor and dielectric materials. This publication will be of particular interest to specialists and students involved in physics, electronics and materials science, as well as to anyone who seeks to understand how the key components of modern electronic devices work. The book discusses in detail various electrophysical and photovoltaic measurement methods that allow us to evaluate the parameters of semiconductors and dielectrics. The authors, having rich experience in their field, share with readers not only theoretical foundations, but also practical aspects of the application of these methods. They explain how to make measurements, what instruments to use and what results can be expected, making the book a useful guide for both beginners and experienced researchers. The topics raised in the book cover a wide range of topics, including semiconductor physics, their electrical properties, and methods for accurately measuring parameters such as conductivity, dielectric permeability, and other important characteristics. The authors focus on how these parameters affect the performance of electronic devices and systems, which makes the book relevant for engineers and developers working in the field of microelectronics and nanoelectronics. The style of presentation of the authors is clear and accessible, which allows the reader to easily assimilate complex concepts. The book is filled with illustrations, graphs and examples, which makes the material more visual and understandable. This is especially important for students and young professionals who are just starting out in science. In addition, the authors include references to current research and development in the text, which allows readers to be aware of the latest achievements in the field of measuring technologies. The book “No. 328 Methods for measuring the parameters of semiconductors and dielectrics” will be of interest not only to specialists, but also to those who want to expand their knowledge in the field of physics and electronics. It will be an excellent addition to the library of any engineer, physicist or student studying modern technology. Readers interested in such works as "Physics of semiconductors" or "Electronic materials and technologies" will find in this book a lot of useful information and new ideas. If you are looking for a source of knowledge about modern measurement methods in the field of semiconductors and dielectrics, this book is what you need. It will not only enrich your wealth of knowledge, but also inspire new research and discoveries. Do not miss the opportunity to immerse yourself in the fascinating world of electrophysical and photovoltaic methods that shape the future of electronics and materials science.