Parameter measurement and testing of semiconductor devices

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The book “Measurement of parameters and testing of semiconductor devices”, created by the team of authors, is a unique work that immerses the reader in the world of semiconductor electronics. This publication will become an indispensable assistant for students, graduate students, engineers and anyone interested in modern technologies and their practical application. The book examines key aspects of measuring parameters of semiconductor devices, such as diodes, transistors and integrated circuits. The authors pay special attention to test methods that allow assessing the characteristics of these devices in different conditions. The reader will be able to learn about the principles of semiconductors, their physical properties and how this knowledge is used in real-world problems. One of the main topics of the book is the importance of measurement and test accuracy in the development and production of semiconductor devices. With the rapid development of technology, where every detail is important, the ability to properly conduct tests becomes critical. The authors share with readers not only theoretical foundations, but also practical recommendations that will help to avoid common errors and improve the quality of work with semiconductors. The book will be of interest to both students of technical specialties and experienced specialists working in the field of electronics and microelectronics .. If you are studying physics, electrical or radio engineering, this edition will be a great addition to your teaching materials. Engineers and researchers will find in the book many useful tips and techniques that can be applied in everyday practice. The style of the authors is distinguished by clarity and accessibility of the presentation, which makes it easy to assimilate even the most complex concepts. The book is filled with illustrations, graphs and examples that make the material more visual and understandable. This is particularly important for technical literature, where visualization plays a key role in understanding. In addition, “Measurement and testing of semiconductor devices” may be of interest to those who want to deepen their knowledge of modern technologies, such as the Internet of Things, artificial intelligence and other high technologies that actively use semiconductor components. Understanding the basics of these devices opens new horizons for creativity and innovation in various fields. If you are looking for books on a similar topic, pay attention to "Physics of semiconductors" or "Electronics for beginners" These works will also help you better understand the world of semiconductors and their application in modern technologies. In conclusion, “Measurement of parameters and testing of semiconductor devices” is not just a textbook, but a real find for everyone who seeks to understand the intricacies of semiconductor electronics. This book inspires new discoveries and experiments, and also serves as a reliable guide in the world of high technology. Do not miss the opportunity to expand your knowledge and skills in this exciting and dynamic field!
LF/829209222/R
Data sheet
- Name of the Author
- Collective of authors
- Language
- Russian