The first monograph in Russia on the most modern electronic electrical and radio measurements and measuring devices used in scientific research, testing and testing of devices and systems of microelectronics and nanotechnology For the first time, measuring instruments used in large-scale microelectronic production and devices of leading companies in their development and production are described in detail: Keithley, Tektronix, Agilent Technologies, Le. Croy, R&S and others. Special attention is paid to the analysis and generation of test signals , measurement of their parameters in the field of small and ultra-small times , measurement of ultra-low currents and voltages, Impedance and chain immitance analysis , Measurement of static and dynamic characteristics of semiconductor devices and integrated circuits, etc.. It is the largest review of modern foreign and domestic measuring instruments on the market of Russia and the world. For engineers, researchers, graduate students, teachers and students of universities and universities of technical and classical types .