The book "Raster electron microscopy and X-ray microanalysis" by J. Gouldstein and his co-authors are a unique work that opens doors to the world of high technology and scientific research. This publication will become a reference book for anyone interested in modern methods of material analysis and micro-images, as well as for students and specialists in the field of physics, materials science and engineering. In this book, the authors examine in detail the principles of raster electron microscopy (REM) and X-ray microanalysis, explaining not only the theoretical foundations, but also the practical aspects of the application of these technologies. The reader is immersed in a world where the smallest details become visible and structures at the nanoscale become available for study. The book covers a wide range of topics, from the fundamentals of electron physics and their interaction with matter to complex analysis techniques such as spectroscopy and mapping. One of the main features of the book is its accessibility .. The authors seek to explain complex concepts in simple and understandable language, making it ideal for undergraduate, graduate and young scientists who are just starting their way into science. However, even experienced researchers will find a lot of useful information in it, including the latest achievements in the field of EM and microanalysis, which makes the book relevant for professionals. The book raises important topics such as accuracy and resolution in microscopy, the impact of various factors on image quality and sample preparation methods. These aspects are critical to the correct interpretation of the data obtained and their application in various fields, including materials science, biology and nanotechnology. Readers will be able to learn how raster electron microscopy helps in the development of new materials, including in the field of electronics and medicine, and how X-ray microanalysis allows you to study the composition and structure of substances at the atomic level. Style J. Gouldstein and his team are distinguished by clarity and logical presentation, which allows the reader to easily absorb information. The authors use many illustrations and examples, which makes the material more clear and understandable. The book includes both theoretical and practical sections, which allows readers not only to understand the basics, but also to apply the knowledge gained in practice. If you’re looking for literature that will help you better understand raster electron microscopy and X-ray microanalysis, then this publication will be your indispensable assistant. It will be useful not only for students and graduate students, but also for experienced researchers working in the field of physics, chemistry and materials science. In conclusion, Raster electron microscopy and X-ray microanalysis is not just a book, but a whole world of possibilities for those who want to explore the invisible and open up new horizons in science. If you are interested in topics such as nanotechnology, microscopy, material analysis, then this publication should definitely take place on your shelf. Do not miss the chance to immerse yourself in the exciting world of science with this outstanding work