Book «No1520 Methods for determining the parameters of thin films and epitaxial layers: lab. Workshop” by G. D. Kuznetsova, V. A. Nikonenko, Y. G. Polistansky and V. P. Sushkova is a unique publication that will become an indispensable assistant for students, graduate students and researchers involved in semiconductor physics, materials science and nanotechnology. In the context of the rapid development of technologies associated with the creation and use of thin films and epitaxial layers, this book offers readers not only theoretical foundations, but also practical techniques that allow them to understand and master this complex but fascinating subject more deeply. The book is a laboratory workshop that covers a wide range of techniques used to determine the parameters of thin films and epitaxial layers. The authors share their rich experience and knowledge, which allows readers not only to get acquainted with the basic principles, but also to immerse themselves in the details of experimental research. Each chapter contains clear instructions, a description of the necessary tools and equipment, as well as examples of real experiments, which makes the material accessible and understandable even for those who are just starting their way in this area. For whom is this book intended? First of all, it will be of interest to students of technical and natural sciences, graduate students and young scientists working in the field of physics, materials science and engineering . However, not only professionals will find useful information in it .. The book can also attract the attention of science lovers who seek to expand their knowledge of modern technologies and research methods. The topics raised in the book cover both fundamental aspects and applied tasks, making it worthy of attention. The authors emphasize the importance of accuracy and reliability of measurements, which is critically important in scientific research and industry. In addition, the book examines the impact of various factors on the properties of thin films, such as temperature, pressure, and composition, allowing readers to better understand how to manage these parameters to achieve the desired results. The style of the authors is distinguished by clarity and accessibility of presentation, which allows the reader to easily assimilate complex concepts. G. D. Kuznetsov and his colleagues are known for their work in semiconductor physics and materials science, and their experience makes this book a valuable source of knowledge. In their portfolio, you can find many other works devoted to similar topics, which confirms their authority and professionalism. If you are looking for a book that will help you understand the methods of studying thin films and epitaxial layers, then “No1520 Methods for determining the parameters of thin films and epitaxial layers: lab. It will become your trusted companion............................................ This edition will not only enrich your knowledge, but also inspire new experiments and research in the field, which continues to actively develop and open new horizons. Do not miss the opportunity to immerse yourself in the world of thin films and epitaxial layers, where science and technology intersect, creating the future!