The book "Modern diagnostic methods for quality control and reliability of semiconductor products" edited by M. and . Gorlov is an important work, which is an extensive study in the field of semiconductor technology. With the rapid development of electronics and information technology, the quality and reliability of semiconductor products are becoming critical to ensure the stable operation of modern devices. This book offers the reader an in-depth understanding of diagnostic techniques that help identify and eliminate potential problems at various stages of semiconductor manufacturing. The book will be of particular interest to students and graduate students of technical specialties, as well as engineers and specialists in the field of electronics, who seek to expand their knowledge of modern methods of quality control. It can also attract the attention of researchers working in the field of materials science and nanotechnology, since semiconductors play a key role in these areas. Readers interested in the reliability and durability of electronic components will find a lot of useful information in this edition. One of the main topics discussed in the book is the importance of diagnostics at all stages of the life cycle of semiconductor products. The authors discuss in detail the methods that allow not only to identify defects, but also to predict their impact on the final characteristics of products. This is especially true in light of the reliability requirements that are imposed on modern electronic devices. The book covers a wide range of diagnostic methods, including non-destructive tests, thermography, radiography and many others. Each method is presented in terms of its application, advantages and disadvantages, which allows the reader to get a holistic view of modern approaches to quality control. The style of presentation in the book is distinguished by scientific rigor and accessibility. The authors strive to convey complex technical concepts to a wide audience, using clear language and illustrative examples. This makes the book not only useful for professionals, but also accessible to those who are just beginning their journey in the field of semiconductors. It also contains illustrations and diagrams that help to better understand the processes and methods described. The book "Modern diagnostic methods for quality control and reliability of semiconductor products" is not just a textbook, but a real find for everyone who is interested in modern technologies and their application. It raises important questions about the future of the semiconductor industry, including the impact of new materials and technologies on product quality and reliability. The authors emphasize that in a rapidly changing market, the constant improvement of diagnostic methods becomes the key to the successful work of companies engaged in the production of electronics. If you are looking for literature that will help you immerse yourself in the world of semiconductors, understand their internal mechanisms and learn how to apply modern quality control methods, then this book will be an excellent choice. It can also be useful for managers and project managers who want to better understand the technical aspects of production and quality management in their teams. Thus, “Modern diagnostic methods for quality control and reliability of semiconductor products” is a must-read for anyone who wants to be at the forefront of semiconductor technology. This book will not only expand your knowledge, but also help you better navigate the complex world of modern technology, which will certainly be your advantage in the professional field.