Physical basis of reliability of integrated circuits
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Issues of theory and practice of reliability of integrated circuits (IC) are considered. The results of physical studies of sudden and gradual failures of elements of hybrid thin-film (TP) IC and semiconductor ICs created on the basis of silicon are summarized in the periodic literature. Ways to ensure and improve reliability . The book can be useful to engineers and researchers involved in the development and production of IP, as well as university students .
LF/205530297/R
Data sheet
- Name of the Author
- Борис Петров
Владимир Сыноров
Миллер Ю.Г. (ред.)
Римма Пивоварова
Татьяна Долматова - Language
- Russian
- Release date
- 1976
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Issues of theory and practice of reliability of integrated circuits (IC) are considered. The results of physical studies of sudden and gradual failures of eleme...