Field guide to displacement measuring interferometry
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This [i]Field Guide [/i]provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry systems and uses. It outlines alignment techniques for optical components, signal processing systems for phase measurements, and laser stabilization for homodyne and heterodyne sources. The concept of displacement measurement uncertainty is discussed with a practical example of calculating uncertainty budgets. For practicing engineers, this [i]Field Guide [/i]will serve as a refresher manual for error sources and uncertainty budgets. For researchers, it will bring new insight to the way in which this technology can be useful in their field. For new engineers, researchers, and students, it will also serve as an introduction into basic alignment techniques for breadboard-based optical systems
LF/804597/R
Характеристики
- ФІО Автора
- Ellis
Jonathan David - Мова
- Англійська
- Серія
- SPIE field guides FG30
- ISBN
- 9780819498014
- Дата виходу
- 2014
15 книг цього ж автора
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This [i]Field Guide [/i]provides a practical treatment of the fundamental theory of displacement measuring interferometry, with examples of interferometry sy...