Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations
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Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.
LF/383946/R
Характеристики
- ФІО Автора
- Amos Tversky
David H. Krantz
Patrick Suppes
R. Duncan Luce - Мова
- Англійська
- ISBN
- 9780124254022
- Дата виходу
- 1989
- Том
- 2
10 книг цього ж автора
Товари з цієї категорії:
Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has ...