Book «No256 Fundamentals of radiation technology of microelectronics: Sect. : Mechanisms of formation and physical nature of radiation processes" authors Ladygina E. A. , Panichkina A. In. , Goryunova N. N. and others is a unique study that immerses the reader in the world of radiation technologies used in microelectronics. This publication will become an indispensable assistant for both undergraduate and graduate students, and for professionals working in the field of microelectronic technologies, radiation physics and materials science. The book covers a wide range of topics related to radiation processes, which play a key role in the development and production of modern microelectronic devices. The authors investigate in detail the mechanisms of radiation defects in semiconductors, their physical nature and the impact on the characteristics of electronic components. The reader will be able to get acquainted with the basics of radiation technology, which is becoming increasingly relevant in the context of the rapid development of technologies and increasing requirements for the reliability and durability of microelectronic devices. One of the main topics discussed in the book is the effect of radiation on materials used in microelectronics. The authors explain how radiation processes can alter the physical properties of semiconductors, which in turn affects their performance and lifespan. This knowledge is especially important for professionals working in the field of developing new materials and technologies, since understanding the radiation effects allows you to create more stable and reliable devices. The book will be of interest not only to students and graduate students studying physics and electronics, but also to engineers working in the field of microelectronics, as well as researchers engaged in research in this field. It will be a useful source of information for those who want to deepen their knowledge about radiation processes and their impact on modern technologies. The style of the authors is distinguished by clarity and accessibility of the presentation, which allows even complex scientific concepts to be presented in an understandable form. The book contains many illustrations and diagrams that help to visualize the processes described and make the material more visual. This is especially important for readers who prefer visual perception of information. In addition, "Fundamentals of radiation technology of microelectronics" can be considered as a continuation of other well-known works of the authors, in which they explore various aspects of microelectronic technologies and materials science. If you are interested in topics such as semiconductor physics, radiation effects in materials or modern technologies in microelectronics, this publication will be a real find for you. The book also raises important questions about the future of microelectronics in the face of growing demands for reliability and resistance to external influences. In the face of global climate change and increasing radiation background, knowledge of radiation processes is becoming critical to the development of new technologies and materials. Thus, "No256 Fundamentals of Radiation Technology of Microelectronics" is not just a textbook, but a real encyclopedia of knowledge that will help readers understand the intricacies of radiation processes and their impact on microelectronic devices. This publication must be in the library of everyone who is interested in modern technologies and strives to be at the forefront of scientific discoveries.