The book "Raster electron microscopy and X-ray microanalysis" by J. Gouldstein and his co-authors are an indispensable work for specialists in the field of materials science, physics, chemistry and related sciences. This work is a deep dive into the world of modern microscopy and analysis techniques, opening up exciting possibilities for the reader, which is provided by raster electron microscopy (REM) and X-ray microanalysis. From the first pages of the book, the reader finds himself at the center of scientific research, where accuracy and detail play a key role. The authors describe in detail the principles of the raster electron microscope, its design and functionality, which makes it possible to understand how this tool is able to reveal the secrets of the microcosm. REM is not just a tool for imaging, it is a powerful analytical method that allows you to explore materials at the atomic level, revealing their structure and composition. The book will be of interest to both students and experienced researchers. Students studying physics, chemistry or materials science will find in it useful information that will help them in their studies and scientific work. For professionals working in laboratories or research institutes, this publication will become a reference book that will help to deepen knowledge and master new techniques of analysis. It will also be useful to engineers and technologists engaged in the development of new materials and technologies. The topics raised in the book cover a wide range of issues, ranging from the basics of raster electron microscopy to complex X-ray microanalysis methods. The authors emphasize the importance of these methods in modern research, emphasizing their role in the study of nanomaterials, semiconductors, biological samples and many other objects. The book also addresses issues related to sample preparation, which is a critical stage for producing quality results. Style J. Gouldstein and his colleagues are distinguished by clarity and accessibility, which makes complex scientific concepts understandable even for those who are just starting their way in this field. The authors use many illustrations and examples, which helps to better understand the material and see the practical application of theoretical knowledge. In addition, the book includes current research and achievements, which makes it especially valuable for those who want to be aware of the latest trends in microscopy and analysis. If you are looking for literature that will help you master raster electron microscopy and X-ray microanalysis, this book will be your reliable assistant. It will not only expand your knowledge, but also inspire new research and discoveries. Readers interested in such topics as nanotechnology, materials science, solid state physics will definitely appreciate the depth and quality of the material presented. In conclusion, “Raster electron microscopy and X-ray microanalysis” is not just a textbook, but a whole encyclopedia of knowledge that will help you immerse yourself in the world of microscopy and analysis. This book is your key to understanding the complex processes taking place at the microscopic level, and to mastering methods that change our understanding of the material world. Do not miss the opportunity to discover new horizons of science with this outstanding work